
ORTEC B Series
Totally depleted silicon surface-barrier detectors
- Detector type
- Totally depleted silicon surface barrier

Bild: ORTEC
Annular partially depleted surface-barrier detectors
ORTEC C Series comprises 16 models (annular partially depleted surface-barrier detectors). The models differ in active area, depletion depth and warranted resolution, among other things – compare them in the model table.
Download product sheet (PDF)All values with references – for tender documents
Specifications checked against the manufacturer’s documents on 2026-10-16
The number after each value refers to the source listed below. Values are as published by the manufacturer; the exact configuration is always confirmed in our quotation.
| Detector type | Annular partially depleted silicon surface barrier1 |
|---|---|
| Resolution measurement conditions | ²⁴¹Am, 5.486 MeV alphas; standard ORTEC electronics; 0.5 µs shaping time constants1 |
| Measurement and warranty temperature | 21 ±1 °C2 |
| Resolution reference geometry | Thin-window point source; distance at least 2 times the detector diameter2 |
| Mount options per product guide | A/T (open back)3 |
| Alpha Suite compatibility | Not guaranteed compatible; requires an approved special for compatibility and warranted specifications3 |
| Central hole | 4 mm standard; 6/8 mm or other geometry by special order1 |
The data comes from the manufacturer’s published documents. Manufacturers may change specifications; the current configuration and performance are confirmed in the quotation.
16 models in the series. Filter or scroll the table to compare.
| Model | Total area including hole4 | Guaranteed maximum alpha resolution4 | Minimum depletion depth4 |
|---|---|---|---|
| C-017-050-100 | 50 mm² | ≤17 keV FWHM | ≥100 µm |
| C-017-050-300 | 50 mm² | ≤17 keV FWHM | ≥300 µm |
| C-017-050-500 | 50 mm² | ≤17 keV FWHM | ≥500 µm |
| C-018-050-1000 | 50 mm² | ≤18 keV FWHM | ≥1000 µm |
| C-019-150-100 | 150 mm² | ≤19 keV FWHM | ≥100 µm |
| C-019-150-300 | 150 mm² | ≤19 keV FWHM | ≥300 µm |
| C-019-150-500 | 150 mm² | ≤19 keV FWHM | ≥500 µm |
| C-020-150-1000 | 150 mm² | ≤20 keV FWHM | ≥1000 µm |
| C-021-300-100 | 300 mm² | ≤21 keV FWHM | ≥100 µm |
| C-021-300-300 | 300 mm² | ≤21 keV FWHM | ≥300 µm |
| C-021-300-500 | 300 mm² | ≤21 keV FWHM | ≥500 µm |
| C-022-300-1000 | 300 mm² | ≤22 keV FWHM | ≥1000 µm |
| C-025-450-100 | 450 mm² | ≤25 keV FWHM | ≥100 µm |
| C-025-450-300 | 450 mm² | ≤25 keV FWHM | ≥300 µm |
| C-025-450-500 | 450 mm² | ≤25 keV FWHM | ≥500 µm |
| C-025-450-1000 | 450 mm² | ≤25 keV FWHM | ≥1000 µm |
The number after each value refers to the source listed below. Values are as published by the manufacturer; the exact configuration is always confirmed in our quotation.

Totally depleted silicon surface-barrier detectors

Partially depleted silicon surface-barrier detectors

Low-background silicon detectors for alpha spectroscopy
We help you choose the right configuration, detector and accessories for your measurement task.