
ModuLab XM MTS materialtestsystem
Materials test system
- Impedance range
- 10 µΩ–100 TΩ depending on module configuration
- EIS frequency range
- 10 µHz–1 MHz with XM MFRA 1MHz
- Maximum output current
- XM MAT: ±100 mA; XM MBST 2A: ±2 A (option)

Bild: AMETEK SI
Photoelectrochemical test system
Measurement system for solar-cell and photoelectrochemical characterization, including perovskite and dye-sensitized cells.
Download product sheet (PDF)All values with references – for tender documents
Specifications checked against the manufacturer’s documents on 2026-10-16
The number after each value refers to the source listed below. Values are as published by the manufacturer; the exact configuration is always confirmed in our quotation.
| Intensity range | 6 decades with ND filter1 |
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| Typical LED stability at maximum power | <2% drift after 24 hours1 |
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| IPCE option | IPCE for quantum efficiency (option)1 |
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| System modules | Potentiostat, FRA and PhotoEchem module1 |
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| Maximum beam divergence | 4°1 |
| Light-source calibration | NIST-traceable1 |
| Measurement modes | IMPS, IMVS, impedance, I–V, photovoltage decay, charge extraction1 |
The data comes from the manufacturer’s published documents. Manufacturers may change specifications; the current configuration and performance are confirmed in the quotation.
The number after each value refers to the source listed below. Values are as published by the manufacturer; the exact configuration is always confirmed in our quotation.

Materials test system

Configurable electrochemical system

Multichannel electrochemical system

Modular multichannel system
We help you choose the right configuration, detector and accessories for your measurement task.