Amptek
Amptek
Escape Peak Software (ESCAPE)
Software · analysis
- Primary function
- Escape-peak adjustment in X-ray spectra
- Detector type
- CdTe
- Ordering code
- ESCAPE
3 referenced values
Bild: Amptek
XRS-FP2
Software · analysis
Quantitative analysis of X-ray spectra.
- Primary function
- Quantitative analysis of X-ray spectra1
- Method
- Fundamental parameters (FP) for XRF1
- Licensed modes
- BULK, MTF and EPXA according to purchased option1
- Outputs
- Element concentrations and/or film thickness1
Download product sheet (PDF)All values with references – for tender documents
Specifications checked against the manufacturer’s documents on 2026-10-16
Overview
Key features
- FP for XRF; ZAF for EPXA mode
- BULK, MTF and EPXA according to purchased option
- Element concentrations and/or film thickness
Specifications
The number after each value refers to the source listed below. Values are as published by the manufacturer; the exact configuration is always confirmed in our quotation.
Detector
| Detectors | Amptek Si-PIN, SDD and CdTe1 |
|---|
Electronics & signal
| Outputs | Element concentrations and/or film thickness1 |
|---|
Software & data
| Primary function | Quantitative analysis of X-ray spectra1 |
|---|---|
| Method | Fundamental parameters (FP) for XRF1 |
| Licensed modes | BULK, MTF and EPXA according to purchased option1 |
| Real-time analysis | Up to 55 elements1 |
Ordering & accessories
| EPXA option | SEM/EDS analysis; licensed option within XRS-FP21 |
|---|
The data comes from the manufacturer’s published documents. Manufacturers may change specifications; the current configuration and performance are confirmed in the quotation.
Sources
The number after each value refers to the source listed below. Values are as published by the manufacturer; the exact configuration is always confirmed in our quotation.
- 1
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7 referenced values
Contact us
Questions about this product?
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Oscar ÅgerstamFounder & CEO