AMETEK SI · Princeton Applied Research
1109917 VersaSCAN-prob
VersaSCAN probe
- Technique
- SKP
- Host platform
- VersaSCAN
- Part number
- 1109917
5 referenced values
Electrochemistry & battery testing
Scanning electrochemistry
Products
AMETEK SI · Princeton Applied Research
224113 VersaSCAN-prob
VersaSCAN probe
- Technique
- SKP
- Host platform
- VersaSCAN
- Part number
- 224113
5 referenced values
AMETEK SI · Princeton Applied Research
224112 VersaSCAN-prob
VersaSCAN probe
- Technique
- SKP
- Host platform
- VersaSCAN
- Part number
- 224112
5 referenced values
AMETEK SI · Princeton Applied Research
224111 VersaSCAN-prob
VersaSCAN probe
- Technique
- SVET
- Host platform
- VersaSCAN
- Part number
- 224111
5 referenced values
AMETEK SI · Princeton Applied Research
224114 VersaSCAN-prob
VersaSCAN probe
- Technique
- LEIS
- Host platform
- VersaSCAN
- Part number
- 224114
5 referenced values
AMETEK SI · Princeton Applied Research
1107001 VersaSCAN-prob
VersaSCAN probe
- Technique
- Soft-probe SECM
- Host platform
- VersaSCAN
- Part number
- 1107001
7 referenced values
AMETEK SI · Princeton Applied Research
224137 VersaSCAN-prob
VersaSCAN probe
- Technique
- SECM
- Host platform
- VersaSCAN
- Part number
- 224137
6 referenced values
AMETEK SI · Princeton Applied Research
224098 VersaSCAN-prob
VersaSCAN probe
- Technique
- DC/AC-SECM
- Host platform
- VersaSCAN
- Part number
- 224098
6 referenced values
AMETEK SI · Princeton Applied Research
VersaSCAN VS-BASE
Scanning electrochemistry
- X travel
- 100 mm
- Y travel
- 100 mm
- Z travel
- 100 mm
5 referenced values
AMETEK SI · Princeton Applied Research
VSC-OSP
Scanning electrochemistry
- Optical measurement range
- ±10 mm
10 referenced values
AMETEK SI · Princeton Applied Research
VSC-SDC
Scanning electrochemistry
- Measurement technique
- Scanning droplet cell
- X travel
- 100 mm (VersaSCAN VS-BASE positioning system)
- Y travel
- 100 mm (VersaSCAN VS-BASE positioning system)
9 referenced values
AMETEK SI · Princeton Applied Research
VSC-SKP
Scanning electrochemistry
- Measurement technique
- SKP
- X travel
- 100 mm (VersaSCAN VS-BASE positioning system)
- Y travel
- 100 mm (VersaSCAN VS-BASE positioning system)
8 referenced values
AMETEK SI · Princeton Applied Research
VSC-SVET
Scanning electrochemistry
- Measurement technique
- SVET
- X travel
- 100 mm (VersaSCAN VS-BASE positioning system)
- Y travel
- 100 mm (VersaSCAN VS-BASE positioning system)
9 referenced values
AMETEK SI · Princeton Applied Research
VSC-LEIS
Scanning electrochemistry
- Measurement technique
- Localized EIS
- X travel
- 100 mm (VersaSCAN VS-BASE positioning system)
- Y travel
- 100 mm (VersaSCAN VS-BASE positioning system)
6 referenced values
AMETEK SI · Princeton Applied Research
VSC-STYLUS
Scanning electrochemistry
- Measurement technique
- Constant-distance SECM
- X travel
- 100 mm (VersaSCAN VS-BASE positioning system)
- Y travel
- 100 mm (VersaSCAN VS-BASE positioning system)
6 referenced values
AMETEK SI · Princeton Applied Research
VSC-SECM
Scanning electrochemistry
- Measurement technique
- DC/AC-SECM
- X travel
- 100 mm (VersaSCAN VS-BASE positioning system)
- Y travel
- 100 mm (VersaSCAN VS-BASE positioning system)
6 referenced values